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Scanning electron microscopes — selection and configuration
A scanning electron microscope (SEM) examines a specimen surface using an electron beam. Applications include materials research, particle analysis, defect investigation and quality control.
Select equipment and request a quotation
State your method, workload and required options to prepare a comparable quotation.
Choosing a SEM
- Electron source and accelerating voltage.
- Resolution under specified measurement conditions.
- High- and low-vacuum modes and detector types.
- Specimen dimensions, stage travel and EDS capability.
Benchtop systems support routine tasks. Configuration depends on the materials and analytical goals. Preparation equipment, coaters, EDS, computers and training are specified individually. Explore related laboratory equipment.
Three tabletop SEM systems compared
| Model | Key differences |
|---|---|
| JEOL JCM-7000Plus | JEOL JCM-7000Plus: high/low vacuum, Zeromag, 40×40 mm XY stage and configuration-dependent EDS. |
| Hitachi TM4000PlusIII | Hitachi TM4000PlusIII: 5–20 kV, Ø80×50 mm specimen, 40×35 mm motorized XY and BSE/UVD; EDS optional. |
| Thermo Scientific Phenom ProX G6 | Phenom ProX G6: CeB6 source, integrated 25 mm² EDS, standard Ø25×35 mm specimen; SED and mapping optional. |
Compare resolution at equivalent detector, voltage, working distance and vacuum conditions. Magnification depends on the defined image size.
See the relevant product page for its price and configuration.
Manufacturer information and documents
Check the version, supply region and document revision. A series page may describe options that are not included in the specific configuration.
Configuration, pricing and procurement
For a quotation, specify the required configuration, number of instruments, installation city and services needed. Agree options, consumables, commissioning and staff familiarisation separately. Documentation, delivery times and warranty terms are specified in the quotation and contract. See the model page for its current price or quotation request option.
Questions before selection and procurement
Which models are listed?
JEOL JCM-7000Plus · Hitachi TM4000PlusIII · Thermo Scientific Phenom ProX G6.
Is EDS elemental analysis included?
Phenom ProX G6 integrates EDS, while mapping and line scans are optional. EDS for JEOL and Hitachi must be confirmed in the specification.
What should be specified in the supply package?
Specimen holders and preparation, detectors, vacuum equipment, computer, monitor, analysis licences and training. These systems support materials research.
How can a fixed price be obtained?
Agree the exact equipment and option list, installation, training and service. A fixed price is established for a confirmed specification; each product page provides a quotation request.