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Atomic force microscopes — selection and configuration
AFM measures interactions between a probe and a sample to map surface topography. Appropriate accessories can extend measurements to mechanical and electrical properties.
Select equipment and request a quotation
State your method, workload and required options to prepare a comparable quotation.
Atomic force microscopy of surfaces
Compare scan range, sample dimensions, operating modes and probe compatibility. Stable measurements require attention to vibration isolation and acoustic protection. Liquid operation, special measurement modes and accessory modules must be included in the system configuration.
Compare three atomic force microscopes
| Model | Scanner and sample |
|---|---|
| Bruker Dimension Icon | Typical XY scan 90 × 90 µm, Z 10 µm; samples up to 210 mm and 15 mm thick |
| Park NX10 | Selected XY 50 × 50 µm, Z 15 µm configuration; samples up to 100 × 100 × 20 mm |
| Park NX20 | 200 mm version; selected XY 100 × 100 µm, Z 15 µm configuration; vacuum wafer chuck |
Sample size, stage positioning travel and scan range are different specifications. The Park listings select specific scanners; other ranges are configuration alternatives. Request a price for the agreed supply package.
Manufacturer information and documents
Check the version, supply region and document revision. A series page may describe options that are not included in the specific configuration.
Configuration, pricing and procurement
For a quotation, specify the required configuration, number of instruments, installation city and services needed. Agree options, consumables, commissioning and staff familiarisation separately. Documentation, delivery times and warranty terms are specified in the quotation and contract. See the model page for its current price or quotation request option.
Questions before selection and procurement
Which models are listed?
Bruker Dimension Icon · Park NX10 · Park NX20.
Is stage travel the same as scan range?
No. The stage positions the sample between sites; the scanner produces the AFM image. NX20 has 200 × 200 mm XY stage travel and a selected 100 × 100 µm scan area. For NX10 these values are 20 × 20 mm and 50 × 50 µm respectively.
Is all photographed equipment included?
Manufacturer photographs illustrate equipment configurations. Specify the acoustic enclosure, vibration isolation, desk, controller, computer, monitors, probes and software licences individually. Electrical modes, liquid measurements and special holders require separate agreement. The NX20 listing covers the 200 mm version; NX20 300 mm is a separate system.
What is needed for a quotation?
Specify sample material, dimensions and topography, measurement modes, XY/Z ranges, laboratory conditions and data processing needs. Agree the probes, supply package, installation, training and service. A fixed price is established for a confirmed configuration.