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JEOL JCM-7000Plus NeoScope is a benchtop scanning electron microscope for surface inspection, defect analysis and quality control. Zeromag links optical navigation with SEM imaging. High- and low-vacuum modes accommodate different specimen requirements.
VOLTAGE5 / 10 / 15 / 20 kVfour selectable stages
SE RESOLUTION6 nm20 kV, WD 12 mm, high vacuum
SPECIMENØ80 × 50 mmmaximum diameter × height