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Hitachi TM4000PlusIII is a tabletop scanning electron microscope for materials research, quality control and education. A motorized stage and navigation camera support specimen positioning, while low-vacuum modes and BSE/UVD detectors accommodate surface-imaging tasks.
VOLTAGE5 / 10 / 15 / 20 kVfour settings
SPECIMENØ80×50 mmmaximum diameter × height
XY STAGE40×35 mmmotorized travel
Key benefits
- Motorized stage with camera-image navigation.
- Four-segment BSE detector.
- UVD secondary-electron detection in low vacuum.
- Combined BSE and SE images.
- Tungsten filament condition monitoring.
- EDS and automated recipes are optional.
Technical specifications
| Model | TM4000PlusIII |
|---|---|
| Type | Tabletop SEM |
| Magnification at 127×95 mm image size | 10–100,000× |
| Accelerating voltage | 5 / 10 / 15 / 20 kV |
| Probe-current levels | 5 |
| Source | Tungsten cartridge |
| XY stage travel | 40×35 mm |
| Maximum specimen | Ø80×50 mm |
| Detectors | BSE (4 segments) / UVD |
| Maximum image size | 2560×1920 px |
| Formats | BMP / TIFF / JPEG |
| Main unit W×D×H | 330×614×547 mm |
| Main unit weight | 55 kg |
| Power supply | 100–240 V AC |
| EDS | Optional |
Applications and configuration
For materials research, industrial quality control and education. This is an analytical SEM, not a clinical diagnostic instrument. Confirm specimen holders, vacuum pump, computer, monitor, EDS, automation and training in the supply package. Manufacturer focusing restrictions apply at 20 kV. Listed magnification is defined at 127×95 mm image size; on-screen magnification depends on display size. The image illustrates a workstation configuration. Request a quote.
Compare with: JEOL JCM-7000Plus.