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JCM-7000Plus NeoScope benchtop SEM
A JEOL electron microscope for specimen morphology and quality control. Zeromag links optical navigation with the transition to SEM imaging.
- 5, 10, 15 and 20 kV landing voltages.
- High- and low-vacuum modes.
- Tungsten electron source.
- Motorised XY stage with 40 mm travel per axis.
- Specimens up to 80 mm diameter and 50 mm height.
The stated 6 nm resolution applies to secondary electron imaging at 20 kV, WD 12 mm and high vacuum. EDS, automation functions, holders and preparation equipment are specified individually. The photograph illustrates a system with a computer. Pricing on request.