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Hitachi HT7800II is a transmission electron microscope for biological and materials research. Its dual-mode objective supports high-contrast and high-resolution imaging. Automated beam adjustment and focusing help reproduce acquisition conditions.
Key benefits
- Dual HC/HR objective modes.
- Automatic electron-beam alignment.
- Autofocus and drift correction.
- Image navigation and whole-view imaging.
- Low-dose imaging for sensitive specimens.
- 3D tomography with configuration-dependent STEM/EDS expansion.
Technical specifications
| Model | HT7800II |
|---|---|
| Manufacturer | Hitachi High-Tech |
| Type | TEM |
| Accelerating voltage | 20–120 kV |
| Voltage increment | 100 V |
| Configuration-dependent cathode | W / LaB6 |
| Objective modes | HC / HR |
| Off-axis lattice resolution at 100 kV | 0.20 nm |
| Maximum magnification | 600,000× |
| Maximum stage tilt | ±70° |
| Focusing | Automatic |
| Image processing | Live FFT / drift correction |
| STEM and EDS | Optional |
Applications and configuration
For prepared thin specimens. The 0.20 nm specification applies to HT7800II; HT7820/HT7830 performance is not applicable. Specify cathode, camera, holders, cryo accessories, STEM/EDS and software modules. Achievable tilt depends on the holder and specimen. Automatic Z alignment requires the optional five-axis stage. The image illustrates an HT7800II workstation. Site preparation, specimen preparation, installation and training are agreed separately. Request a quote.
Transmission electron microscopes
Compare with: JEOL JEM-120i.