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Park NX10 atomic force microscope

In stock
SKU: Park NX10
  • Park NX10 atomic force microscope
Description

Park NX10 is an atomic force microscope for surface research on small samples. Separate XY and Z scanners move the sample and probe along independent axes. This listing describes the configuration with a 50 × 50 µm XY scanner and a 15 µm Z scanner. The photograph illustrates an acoustic enclosure, desk, controller and two monitors; the supply package is agreed separately.

XY SCAN RANGE50 × 50 µmselected configuration
Z SCAN RANGE15 µmselected configuration
SAMPLE100 × 100 mmup to 20 mm thick

Key advantages

  • Independent XY and Z scanners reduce axis crosstalk during topography acquisition.
  • True Non-Contact measures surface interactions without intentional tip contact.
  • Pre-mounted probes and kinematic mounting simplify cantilever replacement.
  • On-axis optics show the sample surface and cantilever for alignment.
  • SmartScan provides an integrated interface for AFM acquisition.
  • The modular architecture supports additional surface-property measurement modes.

Technical specifications

ModelPark NX10
XY scanner50 × 50 µm; alternatives 100 × 100 or 10 × 10 µm
Z scanner15 µm; alternative 30 µm configuration
Sample100 × 100 mm; thickness up to 20 mm
XY stage travel20 × 20 mm
Z stage travel25 mm
Focus travel15 mm
Optical field of view480 × 360 µm with 10× objective
Camera1.2 MP CCD; optional 5 MP
Topography modesContact / True Non-Contact / Tapping / PinPoint
Control softwarePark SmartScan; licences and modules per specification
Acoustic environmentNoise below 65 dB
Floor vibrationVC-D (6.25 µm/s)

Application and configuration

For topography studies of polymers, thin films, semiconductors and other surfaces. Specify sample size and type, environment, required property maps and laboratory conditions. The supply specification defines scanners, probes, holders, controller, software licences, vibration isolation, acoustic enclosure, workstation and installation. Alternative scan ranges, a 5 MP camera, electrical modes and liquid measurements require separate agreement. The photograph does not define guaranteed included items. Request pricing for the agreed package.

Atomic force microscopes

Compare with: Bruker Dimension Icon.

Park NX10

Price upon request
Request the price
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